Interested in working on a challenging project with state-of-the-art design tools, characterization equipment and devices fabricated in modern integrated circuit process technology?
Device Variations Characterization in Advanced IC Processes
Our research group has an extensive background in device mismatch modeling and its effects on analog circuit performance. We are currently engaged in the design of novel process test modules for the characterization of device variability for a number of basic analog and digital circuit cells. We are further developing automated test-setups for the device characterization and model extraction.
We are looking for highly motivated students interested in doing a research project including:
- integrated circuit design,
- device characterization and modeling,
- automated device measurements.
These projects give you a unique opportunity of doing a integrated circuit design, advanced circuit measurements and device characterization and modeling.
Intrigued? Interested?Contact: Prof. P. Kinget
Open for qualified B.S, M.S. or Ph.D students; 1 or group of 2 students
This project can be done for credit.