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Subsections

Research

Low Voltage Analog/RF Circuits

Supply voltages have been scaling with process technology and this is making analog and RF circuit design more and more difficult. Here, we explore the design challenges and find architectural and circuit design techniques to overcome the challenges when we scale supply voltages to extreme limits. We have demonstrated two integrated receivers operating from 0.5V and 0.6V. Please refer to [2] and [4] for more details.
Figure: Die photograph of the 0.5V receiver prototype with extra test structures and test pads.
Image die_photo_receiver2006
Figure: Die photograph of the 0.6V receiver with extra test.
Image die_photo_receiver2007

Mismatch Characterization

Transistor mismatch has been studied traditionally under static operation and the static (or DC) mismatch parameters, $\mathroman{A_{VT}}$ and $\mathroman{A_{\beta}}$, are used to characterize them. In this research, we are exploring whether these mismatch models are accurate enough to explain the mismatch in RF circuits. To study this, we designed and modeled ring-oscillator based test structures and did extensive measurements. Please refer to [3] for more on our findings.
Figure: Die photo of the test structure.
Image die_photo_mismatch2005


next up previous
Next: Publications Up: Ajay Balankutty Previous: Ajay Balankutty