Next: Publications
Up: Ajay Balankutty
Previous: Ajay Balankutty
Subsections
Supply voltages have been scaling with process technology and this is
making analog and RF circuit design more and more difficult. Here, we
explore the design challenges and find architectural and circuit design
techniques to overcome the challenges when we scale supply voltages to
extreme limits. We have demonstrated two integrated receivers operating
from 0.5V and 0.6V. Please refer to [2] and [4] for
more details.
Figure:
Die photograph of the 0.5V receiver prototype with extra test
structures and test pads.
|
Figure:
Die photograph of the 0.6V receiver with extra test.
|
Transistor mismatch has been studied traditionally under static
operation and the static (or DC) mismatch parameters,
and
, are used to
characterize them. In this research, we are exploring whether these
mismatch models are accurate enough to explain the mismatch in RF
circuits. To study this, we designed and modeled ring-oscillator based
test structures and did extensive measurements. Please refer to
[3] for more on our findings.
Figure:
Die photo of the test structure.
|
Next: Publications
Up: Ajay Balankutty
Previous: Ajay Balankutty