Spring 2019: Upcoming Seminars

  • MOSFET degradation due to Hot Carrier Injection in finFETs: statistical variations and the effect of self-heating
          Speaker: Dr. Keith Jenkins
  •       Date: Friday, Apr. 12th, 2pm, CEPSR 414

    Prof. Siddharth Garg
    New York University
    Friday, Mar. 8th, 2:00pm-3:00pm,
    CEPSR 414
    Building Trustworthy Computing Systems: From Hardware to Machine Learning

    How can users trust that their everyday computing platforms, CPUs, GPUs and ASICs, are performing computations privately and correctly? Users have good reason to skeptical of the trustworthiness of existing computing systems. For one, most computing hardware is increasingly manufactured off-shore at one of only a few advanced semiconductor foundries. Malicious foundries might pirate and black-market a chip, or potentially even modify its functionality (i.e., insert a hardware Trojan). The first part of this talk will cover my work on how chips can be securely fabricated at untrusted off-shore foundries; the hope is to reap the benefits of advanced manufacturing technology (which might only be available off-shore) without compromising trust. Another reason for skepticism is the move towards edge and cloud computing. Increasingly, expensive computations are outsourced to (a potentially untrusted) cloud, and particularly so with modern machine learning computations that rely on deep learning. The second part of this talk will cover my work on how outsourced training of deep neural networks introduces new security vulnerabilities, particularly the threat of a backdoored neural network (or BadNets), and how these vulnerabilities can be mitigated. I will conclude by highlighting on-going work in my lab on designing robust and secure deep learning accelerators.

    Siddharth Garg is an Assistant Professor at New York University in the ECE department. His general research interests are in computer engineering, and more particularly in secure, reliable and energy-efficient computing. For his work, Siddharth has received the NSF CAREER Award (2015), a "Top Picks in Hardware Security" for his NDSS'15 paper, and best paper awards at the IEEE Symposium on Security and Privacy (S&P) 2016, USENIX Security Symposium 2013, NIPS Machine Learning Security Workshop (2017) and the International Symposium on Quality in Electronic Design (ISQED) in 2009. Siddharth also received the Angel G. Jordan Award from ECE department of Carnegie Mellon University for outstanding thesis contributions and service to the community. He serves on the technical program committee of several top conferences in the area of computer engineering and computer hardware, and has served as a reviewer for several IEEE and ACM journals. He received his Ph.D. degree in Electrical and Computer Engineering from Carnegie Mellon University in 2009, an M.S. from Stanford in 2005 and a B.Tech. degree in Electrical Engineering from the Indian Institute of Technology Madras.

    Prof. Sameer Sonkusale
    Tufts University
    Friday, Mar. 29th, 2:00pm-3:00pm
    CEPSR 750
    Hanging by a thread: sensors, microfluidics, electronics and drug delivery

    This talk will explore the new realm of using threads as an ultimate platform for flexible and stretchable bioelectronics. Threads offer unique advantages of universal availability, low cost, material diversity and simple textile-based processing. In this talk, I will report reel-to-reel fabrication to make functional smart threads for variety of sensing and electronics application. For example I will report on nanomaterial-infused smart threads for strain and temperature sensing. Threads will be presented for sensing pH, glucose, and other chemical biomarkers. Interestingly, threads also provide an ideal platform for passive microfluidic sampling and delivery of analytes. I will show our recent work on using this toolkit of thread-based microfluidics, sensors and electronics for application as surgical sutures and flexible smart bandages for chronic wounds. Our recent work on using threads for closed loop spatiotemporal dosage controlled drug delivery will also be presented. If there is time, I will present some research activities on chemical sensor array aka artificial nose, and on CMOS image sensors to support such sensing functions.

    Sameer Sonkusale is currently a Professor of Electrical and Computer Engineering at Tufts University with a joint appointment in the department of Biomedical Engineering. He is currently on sabbatical at the Wyss Institute at Harvard University and at Brigham and Women's Hospital of Harvard Medical School. At Tufts University, Dr. Sonkusale directs an interdisciplinary research group Nano Lab with research focus on micro- and nano- fabrication, nanoscale sensors, biomedical microdevices, circuits and systems. Prior to coming to Tufts, he was an Assistant Professor at Texas A&M University from 2002 to 2004 and also held the position of visiting associate professor of medicine at Harvard Medical School and Brigham and Women's Hospital for 2011-2012. Dr. Sonkusale received his MS and PhD in Electrical Engineering from the University of Pennsylvania. He has received several awards including the National Science Foundation CAREER award in 2010. He is an alumnus of the National Academy of Engineering US Frontiers of Engineering meeting in 2015, and the National Academy of Sciences Arab-America Frontiers meeting in 2014 and 2016. Dr. Sonkusale is on the editorial boards of Nature Scientific Reports, IEEE Transactions on Biomedical Circuits and Systems, Journal of Low Power Electronics and Application, and Electronic Letters. He is a senior member of the IEEE, and a member of OSA, MRS, BMES and AAAS.

    Dr. Keith Jenkins
    Formerly IBM
    Friday, Apr. 12th 2:00pm-3:00pm
    CEPSR 414
    MOSFET degradation due to Hot Carrier Injection in finFETs: statistical variations and the effect of self-heating

    MOSFET degradation due to Hot Carrier Injection in finFETs: statistical variations and the effect of self-heating Device degradation, or aging, is a continuing concern for CMOS circuits, and estimating product lifetime demands a proper assessment of such degradation. Of the known degradation mechanisms, that due to channel hot carrier injection (HCI) is taking an increasingly prominent role in contemporary CMOS technologies. The seminar presents experiment studies of HCI degradation in modern finFETs, particular in regard to the effect of self-heating, which can impact lifetime projection, and on the change of the statistical distribution of FET parameters as they degrade, which can affect the design margins assumed by circuit designers.

    Keith Jenkins was a Research Staff Member at the IBM Thomas J. Watson Research Center from 1983 to 2018. In this position, he did research in a variety of device and circuit subjects, including high frequency measurement techniques, electron beam circuit testing, radiation- device interactions, low temperature electronics, SOI technology, and substrate crosstalk in circuits. His most recent activities include designing circuits for analog on-chip self- measurement, evaluating the frequency response of nanoscale devices, studying the impact of self-heating in advanced CMOS technologies, and designing compact and efficient structures to measure circuit and device reliability. He has a PhD in physics from Columbia University, for experimental work in high energy physics.

    Dr. Ahmed M. A. Ali
    Analog Devices Fellow
    Friday, Apr. 19th, 2:00pm-3:00pm
    CEPSR 414
    [SSCS Distinguished Lecture] Digitally-Assisted Data Converters

    Data converters are the interface between the real analog world and the digital realm. They are so ubiquitous that on any given day every person in the developed world will likely utilize a data converter in one form or another. The insatiable need for higher resolution A/D converters (ADCs) at higher sample rates has made digital assistance a necessity. In this talk, we will discuss some of the common architectures and advanced calibration techniques for high-speed and high-resolution ADCs. These include techniques to correct for non-linearity, settling, kick-back, and memory errors. The talk will discuss the advantages and limitations of the different approaches, practical considerations and some state-of-the-art examples.

    Ahmed M. A. Ali received the B.Sc. and M.Sc. degrees, with distinction and highest honor in electrical engineering from Ain Shams University, Cairo, Egypt, and the Ph.D. degree in electrical engineering from the University of Pennsylvania, Philadelphia. He is currently a Fellow at Analog Devices, where he has led the design and development of several industry and world firsts in the high-speed data converter field. His past industrial experience include Texas Instruments, Anacad/Mentor Graphics, and Siemens AG. He was an Adjunct Assistant Professor at the University of Pennsylvania from 2001 to 2007 and is an IEEE SSCS Distinguished Lecturer. He currently serves on the ISSCC Data Converter sub-committee and as an Associate Editor of the IEEE Transactions on Circuits and Systems I: Regular Papers. He is the author of the book: "High Speed Data Converters", published by the Institution of Engineering & Technology (IET) in 2016. He is the principal author of more than 30 papers and holds 50 patents. His research interests include analog IC design, high linearity sampling, digitally assisted converters, and signal processing. Dr. Ali received the S.J. Stein award from the University of Pennsylvania. He is also the recipient of the George Stephenson Foundation award, the Catalyst Foundation fellowship award, the University of Pennsylvania fellowship, and several industry and academic excellence awards.

    Spring 2019 Seminars

  • Title: Building Trustworthy Computing Systems: From Hardware to Machine Learning
          Speaker: Prof. Siddharth Garg
  •       Date: Friday, March 8th, 2pm, CEPSR 414

  • Title: Hanging by a thread: sensors, microfluidics, electronics and drug delivery
          Speaker: Prof. Sameer Sonkusale
  •       Date: Friday, Mar. 29th, 2pm, CEPSR 750

  • Title: MOSFET degradation due to Hot Carrier Injection in finFETs: statistical variations and the effect of self-heating
          Speaker: Dr. Keith Jenkins
  •       Date: Friday, Apr. 12th , 2pm, CESPR 414

  • Title: [SSCS Distinguished Lecture] Digitally-Assisted Data Converters
          Speaker: Dr. Ahmed M. A. Ali
  •       Date: Friday, Apr. 19th, 2pm, CEPSR 414

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